SCI Journal

Impact Factor Database

Microelectronic Engineering

Basic Journal Info


Journal ISSN: 1679317
Publisher: Elsevier BV
History: 1977, 1983-ongoing
Journal Hompage: Link

Research Categories

Microelectronic Engineering

Impact Factor


Impact Factor


Impact Factor



Microelectronics Journal invites significant research and application papers in all the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. Microelectronics Journal covers circuits and systems. This includes, but is not limited to: • Analogue, digital, mixed, and RF circuit design methodologies • Logic, architectural and system level synthesis • Testing, design for testability, built in self-test • Area, power and thermal evaluation • Mixed-domain simulation and design • Formal verification • Embedded systems • Design and test aspects of high density integration (3D, etc.) • SoC, NoC, SIP, NIP design and test • Emerging devices as FinFETs, SETs, etc.

Microelectronic Engineering

2-year Impact Factor Trend
Note: impact factor data for reference only

Microelectronic Engineering

3-year Impact Factor Trend
Note: impact factor data for reference only

Microelectronic Engineering

4-year Impact Factor Trend
Note: impact factor data for reference only

Impact Factor

The impact factor (IF) or journal impact factor (JIF) of an academic journal is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. In other words, the impact factor of 2020 is the average of the number of cited publications divided by the citable publications of a journal. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Normally, journals with higher impact factors are often deemed to have more influence than those with lower ones. However, the science community has also noted that review articles typically are more citable than research articles.

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Microelectronic Engineering

Impact Factor History
  • 2019 Impact Factor 2.462
  • 2018 Impact Factor 1.820
  • 2017 Impact Factor 2.226
  • 2016 Impact Factor 2.019
  • 2015 Impact Factor 1.543
  • 2014 Impact Factor 1.479
  • 2013 Impact Factor 1.559
  • 2012 Impact Factor 1.569
  • 2011 Impact Factor 1.999
  • 2010 Impact Factor 1.966
  • 2009 Impact Factor 1.791
  • 2008 Impact Factor 1.859
  • 2007 Impact Factor 1.847
  • 2006 Impact Factor 1.791
  • 2005 Impact Factor 1.619
  • 2004 Impact Factor 1.673
  • 2003 Impact Factor 1.346
  • 2002 Impact Factor 0.992
  • 2001 Impact Factor 0.850
  • 2000 Impact Factor 0.521
Note: impact factor data for reference only

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Other Journal Impact Indicator

Any journal impact factor or scientometric indicator alone will not give you the full picture of a science journal. That’s why every year, scholars review current metrics to improve upon them and sometimes come up with new ones. There are also other factors to sider for example, H-Index, Self-Citation Ratio, SJR (SCImago Journal Rank Indicator) and SNIP (Source Normalized Impact per Paper). Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed.

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Microelectronic Engineering


The h-index is an author-level metric that attempts to measure both the productivity and citation impact of the publications of a scientist or scholar. The index is based on the set of the scientist's most cited papers and the number of citations that they have received in other publications


Microelectronic Engineering

SCImago Journal Rank (SJR)

SCImago Journal Rank (SJR indicator) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.