Microelectronics Reliability
Impact Factor & Key Scientometrics

Microelectronics Reliability
Overview

Impact Factor

1.589

H Index

96

Impact Factor

1.576

I. Basic Journal Info

Country

Netherlands
Journal ISSN: 262714
Publisher: Elsevier BV
History: 1962-ongoing
Journal Hompage: Link
How to Get Published:

Research Categories

Microelectronics Reliability
Impact Factor by Web of Science

Index

SCIE/SSCI

Impact Factor

1.589

by WOS

Ranking

9087

by WOS

Microelectronics Reliability
SJR, SJR Impact Factor and H Index

H Index

96

SJR

0.445

Scopus Impact Factor

1.576

Microelectronics Reliability
SJR Impact Factor 2-year, 3-year, 4-year

2-year
Impact Factor

1.576

3-year
Impact Factor

1.813

4-year
Impact Factor

1.576

Scope/Description:

Microelectronics Reliability is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems. The coverage of the journal includes the following topics: physics and analysis; evaluation and prediction; modelling and simulation; methodologies and assurance. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, packaging and testing, will also be welcome, and practical papers reporting case studies in the field are particularly encouraged.

II. Science Citation Report (SCR)



Microelectronics Reliability
SCR Impact Factor

Microelectronics Reliability
SCR Journal Ranking

Microelectronics Reliability
SCImago SJR Rank

SCImago Journal Rank (SJR indicator) is a measure of scientific influence of scholarly journals that accounts for both the number of citations received by a journal and the importance or prestige of the journals where such citations come from.

0.445

Microelectronics Reliability
Scopus 2-Year Impact Factor Trend

Note: impact factor data for reference only

Microelectronics Reliability
Scopus 3-Year Impact Factor Trend

Note: impact factor data for reference only

Microelectronics Reliability
Scopus 4-Year Impact Factor Trend

Note: impact factor data for reference only

Microelectronics Reliability
Impact Factor History

2-year 3-year 4-year
  • 2021 Impact Factor
    1.576 1.813 1.905
  • 2020 Impact Factor
    1.92 2.075 1.992
  • 2019 Impact Factor
    2.034 1.987 1.936
  • 2018 Impact Factor
    1.831 1.789 1.74
  • 2017 Impact Factor
    1.557 1.649 1.75
  • 2016 Impact Factor
    1.602 1.724 1.927
  • 2015 Impact Factor
    1.715 1.958 1.956
  • 2014 Impact Factor
    2.081 NA NA
  • 2013 Impact Factor
    1.708 NA NA
  • 2012 Impact Factor
    1.609 NA NA
  • 2011 Impact Factor
    1.726 NA NA
  • 2010 Impact Factor
    1.672 NA NA
  • 2009 Impact Factor
    1.482 NA NA
  • 2008 Impact Factor
    1.67 NA NA
  • 2007 Impact Factor
    1.546 NA NA
  • 2006 Impact Factor
    1.383 NA NA
  • 2005 Impact Factor
    1.315 NA NA
  • 2004 Impact Factor
    0.947 NA NA
  • 2003 Impact Factor
    0.877 NA NA
  • 2002 Impact Factor
    0.879 NA NA
  • 2001 Impact Factor
    0.816 NA NA
  • 2000 Impact Factor
    0.474 NA NA
Note: impact factor data for reference only

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Impact Factor

Impact factor (IF) is a scientometric factor based on the yearly average number of citations on articles published by a particular journal in the last two years. A journal impact factor is frequently used as a proxy for the relative importance of a journal within its field. Find out more: What is a good impact factor?


III. Other Science Influence Indicators

Any impact factor or scientometric indicator alone will not give you the full picture of a science journal. There are also other factors such as H-Index, Self-Citation Ratio, SJR, SNIP, etc. Researchers may also consider the practical aspect of a journal such as publication fees, acceptance rate, review speed. (Learn More)

Microelectronics Reliability
H-Index

The h-index is an author-level metric that attempts to measure both the productivity and citation impact of the publications of a scientist or scholar. The index is based on the set of the scientist's most cited papers and the number of citations that they have received in other publications

96

Microelectronics Reliability
H-Index History